Invited Speakers
Confirmed Invited Speakers to CPO-8:
- H. Muller (CEOS, Germany)
Achromat and Aplanatic Aberration Correctors - E. Plies (Universitat Tubingen, Germany)
The Wien filter: History, Fundamentals and Modern Applications - H. Wollnick (Universitat Geissen, Germany)
Plenary talk on CPO conference series - M. Fujinami (Chiba University, Japan)
Formation of a Positron Microprobe and the Applications - K. Tsuno (EOST, Japan)
Monochromators in Electron Microscopy - E. Munro (MEBS, UK)
Numerical Simulation Methods for Electron and Ion Optics - M. Mankos (Electron Optica, USA)
Electron Optics for Dual-Beam Low Energy Electron Microscopy - R. Hill (Carl Zeiss, USA)
Advances in Helium Ion Microscopy - H. Rose (TU Darmstadt, Germany)
Outline of an Aberration-corrected Low-voltage Phase Electron Microscope - N. Dellby (NION, USA)
Optimal Compensation of Axial Aberrations of All Orders in the STEM - M. El-Gommati (York University, UK)
Towards the Quantification of Scanning Electron Microscopy - M. Berz (Michigan State University, USA)
Optics and Nonlinear Effects in Repetitive Systems - Cai Yunhai (SLAC, USA)
Beam Dynamics in Ultra-low Emittance Storage Rings - David Edwards (IJL research center, USA)
Multi Region FDM Process: Determining Highly Accurate Potentials for Cylindrical Symmetric Geometries - Frank Read (CPO Ltd, UK)
The BEM for Charged Particle Optics - J.A. van Kan (NUS)
Proton Beam Nano-probe Technology and Applications - Ludek Frank (ISI AS CR, Czech Republic)
Very Low Energy Scanning Electron Microscopy
