Conference Chair: Anjam Khursheed, National University of Singapore, Singapore
Program Chair: Daniel S. Pickard, National University of Singapore, Singapore
About CPO
The CPO conference series was started in 1980 with the aim of bringing together three scientific communities in the charged particle optics area: accelerator optics, spectrometer optics, and electron optics. The first meeting (1980) was held in Giessen, Germany, followed by conferences at Albuquerque (USA), Toulouse (France) in 1990, Tsukuba (Japan) in 1994, Delft (Netherlands) in 1998, University of Maryland (USA) in 2002, and in Cambridge (England) in 2006. Each venue has been associated with one branch or another of the subject, and each conference was organized and hosted by a well-known figure in the world of charged particle optics.
Poster papers will be exhibited in the Poster Room for the duration of the conference. The conference will have an open forum software demo session, where scientists can bring in their laptops and display/share computational tools with one another. An Abstract for each demo software will be included in the Conference Program. The software demo is open to all participants and can feature a wide variety of simulation techniques and methods related to charged particle optics problems, such as field distribution solving, aberration computations, and direct ray tracing. For companies, please consider giving a talk in our commercial session, booking a table in the poster room, and taking up a sponsorship package. Participants will have a wide variety of interests, ranging from charged particle optics software, through to charged particle optics instrumentation, and beyond this, to related analytical instrumentation in general. We are also planning to run a bookstall.
Download Full Conference Program (as of 2 July 2010)
Subjects of interest
Abstracts on a wide range of different research areas related are welcome. These include the following areas:
- Source/Gun design
- Beam transport and characterization
- Energy and mass spectrometers
- Aberration theory and correction methods
- Simulation of field distributions
- Particle tracking and ray tracing methods
- Novel imaging methods
- Electron emission microscopes (LEEM/PEEM)
- Electron and Ion microscopes
- Electron/Ion beam lithography
- Curved axis systems
- Multiple Beam Systems
- Electron Mirrors
- Sources for Field Emission Displays
Conference Highlights
- Oral sessions
- Poster session
- Software session
- Banquet
- Proceedings to be published in the special issue of the Nuclear Instruments and Methods in Physics Research A journal
